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Fiber optic test and measurement / Dennis Derickson, editor

Colaborador(es): Derickson, Dennis [editor].
Tipo de material: materialTypeLabelLibroEditor: Upper Saddle River, NJ : Prentice Hall, 1998Descripción: xx, 642 páginas : ilustraciones.ISBN: 0-13-534330-5.Tema(s): Telecomunicaciones | Fibras ópticas | Sistemas de transmisión de datosClasificación CDD: 621.38275 F443o
Contenidos:
-Introduction to fiber optics systems and measurements -Optical power measurement -Optical spectrum analysis -Wavelength meters -High resolution optical frequency analysis -Polarization measurements -Intensity modulation and noise characterization of optical signals -Analysis of digital modulation on optical carriers -Insertion loss measurements -Optical reflectometry for component characterization -OTDRs and backscatter measurements -Dispersion measurements -Characterization of Erbium-doped fiber amplifiers -Noise sources in optical measurements -Nonlinear limits for optical measurements -Fiber optics conectors and their care
Tipo de ítem Biblioteca de origen Colección Signatura Copia número Estado Fecha de vencimiento Código de barras Reserva de ejemplares
Libro (Col. General) Libro (Col. General) Campus I
Colección General 621.38275 F443o (Navegar estantería) Ej. 1 Disponible 101149
Libro (Col. General) Libro (Col. General) Campus I
Colección General 621.38275 F443o (Navegar estantería) Ej. 2 Disponible 101163
Libro (Col. General) Libro (Col. General) Campus I
Colección General 621.38275 F443o (Navegar estantería) Ej. 3 Disponible 101164
Reservas Totales: 0

CAMPUS II

-Introduction to fiber optics systems and measurements
-Optical power measurement
-Optical spectrum analysis
-Wavelength meters
-High resolution optical frequency analysis
-Polarization measurements
-Intensity modulation and noise characterization of optical signals
-Analysis of digital modulation on optical carriers
-Insertion loss measurements
-Optical reflectometry for component characterization
-OTDRs and backscatter measurements
-Dispersion measurements
-Characterization of Erbium-doped fiber amplifiers
-Noise sources in optical measurements
-Nonlinear limits for optical measurements
-Fiber optics conectors and their care